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OE1022 lock-in amplifier of Sine Scientific Instruments are widely used in STM measuring system


Scanning Tunneling Microscope (STM) is an instrument used to detect material surface structure, base on the tunneling effect in the field of quantum theory. STM enables scientists to observe and locate individual atoms with higher resolution than its atomic force counterparts.

Scanning Tunneling Microscope (STM) is an instrument used to detect material surface structure, base on the tunneling effect in the field of quantum theory. STM enables scientists to observe and locate individual atoms with higher resolution than its atomic force counterparts.

As an indispensable measuring instrument in the atomic world, the lock-in amplifier plays a crucial role in STM. The OE1022 lock-in amplifier of Sine Scientific Instruments is widely used in STM measuring systems. The STM industry widely recognizes the quality of Sine Scientific Instruments products.

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Fig.1 OE1022 is used for better performance of Scanning Tunneling Microscope at Sun Yat-sen University (for over five years)

Professor Dingyong Zhong of Sun Yat-sen university used STM to characterize the Graphene nanoribbons (GNRs). The results were published in Nature Communications.

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Fig.2 OE1022 is used for better performance of Scanning Tunneling Microscope at Shanghai Jiao Tong University (for over 5 years)

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Fig.3 Application of domestic lock-in amplifier OE1022 was highly recognized and recommended by professors of the University of Science and Technology of China.

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Fig.4 STM is used with OE1022 at South China University of Technology.

Appendix 1: Articles published with the application of STM and OE1022.

1 M. Z. Liu, M. X. Liu, L. M. She, Z. Q. Zha, J. L. Pan, S. C. Li, T. Li, Y. Y. He, Z. Y. Cai, J. B. Wang, Y. Zheng, X. H. Qiu*, and D. Y. Zhong*, Graphene-like nanoribbons periodically embedded with four- and eight-membered rings. Nature Communications 8, 14924 (2017).

2 Ming-Chao Duan,1 Zhi-Long Liu,1 Jian-Feng Ge,1 Zhi-Jun Tang,1 Guan-Yong Wang,1 Zi-Xin Wang,2 Dandan Guan,1,3 Yao-Yi Li,1,3 Dong Qian,1,3 Canhua Liu,1,3,a)
and Jin-Feng Jia1,3,a) Development of in situ two-coil mutual inductance technique in a multifunctional scanning tunneling microscope
 REVIEW OF SCIENTIFIC INSTRUMENTS 88, 073902 (2017)

 

Appendix 2: User report of Scanning Tunneling Microscope measurement at Shanghai jiao tong university.

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